Dimension Edge Specifications |
X-Y Scan Range | 90μm x 90μm typical, 85μm minimum |
Z Range | 10μm typical in imaging and force ramp modes, 9.5μm minimum |
Vertical Noise Floor | <50pm RMS in appropriate environment, typical imaging bandwidth (up to 625Hz) |
XY Position Sensor Noise Level (Closed Loop) | <0.5nm RMS typical imaging bandwidth (up to 625Hz) |
Z Position Sensor Noise Level (Closed Loop) | <0.2nm RMS typical imaging bandwidth (up to 625Hz) |
Sample/Size/Holder | 150mm vacuum chuck, 15mm thick; Up to 40mm thick with optional frame spacer |
Motorized Positioning Stage (X-Y axis) | 150mm x 150mm inspectable area; Programmable for multi-site measurements |
Microscope Optics | 5-megapixel digital camera; 180μm to 1465μm viewing area; Digital zoom and motorized focus |
Signal Access | Configurable I/O signal access built into controller; Includes customizable signal routing, digital feedback, and dual digital lock-in |
Single Point Spectroscopy | Three-axis closed loop control for point-and-shoot positioning and ramping; Spring constant calibration with built-in thermal tune |
Sample Temperature Control | -35 to +250°C with optional heater/cooler accessory; Includes gas purging capability |
AFM Modes |
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Standard | Contact Mode, Lateral Force Microscopy, TappingMode™, PhaseImaging™, LiftMode, Magnetic Force Microscopy, Electric Force Microscopy, Dark Lift, Force Spectroscopy, Nanoindentation, Nanolithography, Adhesion, ScanAsyst |
Optional | Scanning Tunneling Microscopy, Conductive AFM, Tunneling AFM, Scanning Capacitance Microscopy, Surface Potential Microscopy, Piezoresponse Microscopy, Force Modulation Microscopy, Liquid Imaging, Thermal Analysis, Electrochemical AFM |
Probes | Visit www.brukerAFMprobes.com to see our ocmprehensive listing of probes, including Bruker-exclusive ScanAsyst probes |
Facility Requirements |
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Vibration Isolation | Vibration isolation table or integrated vibration/acoustic isolation enclosure required |
Laser Classification | Class 2M |
Certification | CE |